US Patent Issued to NTT on Oct. 6 for "Testing device, testing method, and testing program" (Japanese Inventor)

ALEXANDRIA, Va., Oct. 6 -- United States Patent no. 12,756,647, issued on Oct. 6, was assigned to NTT Inc. (Tokyo).

"Testing device, testing method, and testing program" was invented by Hiroshi Kurakami (Musashino, Japan).

According to the abstract* released by the U.S. Patent & Trademark Office: "A test device includes processing circuitry configured to access a test target site managed by a test target device to acquire information on the test target site, and specify test settings for increasing a processing load of the test target device based on the information, manage session information of a test packet for increasing a processing load on the test target device, construct a test session with the test target device according to a sc...