US Patent Issued to NTT on May 12 for "Measurement system, measurement method, measurement device, and program" (Japanese Inventors)

ALEXANDRIA, Va., May 12 -- United States Patent no. 12,622,639, issued on May 12, was assigned to NTT INC. (Tokyo).

"Measurement system, measurement method, measurement device, and program" was invented by Kei Kuwabara (Tokyo), Kenichi Matsunaga (Tokyo) and Takayuki Ogasawara (Tokyo).

According to the abstract* released by the U.S. Patent & Trademark Office: "A measurement system includes a measurement unit configured to perform measurement a plurality of times on the basis of a first clock signal having a first clock period to obtain a plurality of measurement results, a time stamp provision unit configured to provide a time stamp indicating a measurement time to each measurement result obtained in the second period among the plurality o...