US Patent Issued to NTT on March 3 for "Measuring method for optical nonlinearity of two-dimensional material" (Japanese Inventors)

ALEXANDRIA, Va., March 3 -- United States Patent no. 12,566,354, issued on March 3, was assigned to NTT Inc. (Tokyo).

"Measuring method for optical nonlinearity of two-dimensional material" was invented by Yuya Yonezu (Musashino, Japan), Atsushi Ishizawa (Musashino, Japan), Hidetaka Nishi (Musashino, Japan), Tai Tsuchizawa (Musashino, Japan), Nobuyuki Matsuda (Musashino, Japan), Rai Takahashi (Musashino, Japan) and Koji Yamada (Musashino, Japan).

According to the abstract* released by the U.S. Patent & Trademark Office: "An optical nonlinearity measurement method according to the present disclosure utilizes photon pair generation through a spontaneous four-wave mixing process, to observe photon pairs using an optical waveguide loaded with...