US Patent Issued to NTT on March 24 for "Light intensity distribution pattern measuring device and method" (Japanese Inventor)

ALEXANDRIA, Va., March 24 -- United States Patent no. 12,584,818, issued on March 24, was assigned to NTT Inc. (Tokyo).

"Light intensity distribution pattern measuring device and method" was invented by Shingo Ono (Musashino, Japan).

According to the abstract* released by the U.S. Patent & Trademark Office: "A light intensity distribution pattern measurement device according to the present disclosure includes: a two-dimensional imaging sensor for receiving multiplexed light that is obtained by multiplexing transmitted light obtained by injecting one branched light of first continuous light into an optical fiber under measurement, reference light that is the other branched light of the first continuous light, and local light; and a signal ...