US Patent Issued to NTT on June 30 for "Optimizing machine learning models using binarized parameter matrices and iterative re-randomization" (Japanese Inventors)

ALEXANDRIA, Va., July 16 -- United States Patent no. 12,670,443, issued on June 30, was assigned to NTT Inc. (Tokyo).

"Optimizing machine learning models using binarized parameter matrices and iterative re-randomization" was invented by Daiki Chijiwa (Musashino, Japan), Kenji Umakoshi (Musashino, Japan), Tomohiro Inoue (Musashino, Japan) and Daigoro Yokozeki (Musashino, Japan).

According to the abstract* released by the U.S. Patent & Trademark Office: "A learning model optimization device includes a binarization matrix setting unit configured to set a binarization matrix m in which each element is a numerical value of "0" or "1" and a transformed matrix setting unit configured to set a transformed matrix M having, as an element, a product...