US Patent Issued to NSK on Feb. 17 for "Possibility evaluation method of white structure flaking and measurement device used for evaluation method" (Japanese Inventors)

ALEXANDRIA, Va., Feb. 17 -- United States Patent no. 12,553,468, issued on Feb. 17, was assigned to NSK Ltd. (Tokyo).

"Possibility evaluation method of white structure flaking and measurement device used for evaluation method" was invented by Kakeru Enami (Fujisawa, Japan), Hiroki Yamada (Fujisawa, Japan) and Hideyuki Uyama (Fujisawa, Japan).

According to the abstract* released by the U.S. Patent & Trademark Office: "An object is to provide an evaluation method for detecting the amount of hydrogen supposed to influence white structure flaking in a simple manner in a short period of time and evaluating possibility of white structure flaking from the detected hydrogen amount. The provided is a possibility evaluation method of white structur...