US Patent Issued to Northwest A&F University on March 24 for "Method for improving wheat resistance to fusarium head blight (FHB) by genome editing" (Chinese Inventors)

ALEXANDRIA, Va., March 24 -- United States Patent no. 12,584,141, issued on March 24, was assigned to Northwest A&F University (China).

"Method for improving wheat resistance to fusarium head blight (FHB) by genome editing" was invented by Jun Guo (Xianyang, China), Fuxin He (Xianyang, China), Zhensheng Kang (Xianyang, China), Huilin Sun (Xianyang, China), Xingxuan Bai (Xianyang, China), Ce Wang (Xianyang, China) and Yanfeng Wang (Xianyang, China).

According to the abstract* released by the U.S. Patent & Trademark Office: "A method for improving wheat resistance to Fusarium head blight (FHB) by genome editing is provided, and further provided is use of TaCIPK14 protein or related biomaterial thereto in the regulation of plant resistance t...