US Patent Issued to New York University on March 31 for "System and method for robotic inspection" (New York Inventors)

ALEXANDRIA, Va., March 31 -- United States Patent no. 12,591,041, issued on March 31, was assigned to New York University (New York).

"System and method for robotic inspection" was invented by Chen Feng (New York), Semiha Ergan (New York), Bilal Sher (New York), Xuchu Xu (New York), Guanbo Chen (New York), Talha Javed (New York), Sruti Madhusudhan (New York), Siddharth Mahesh (New York), Aravindan Vasudevan (New York), Daniel Lu (New York) and Beyza Kiper (New York).

According to the abstract* released by the U.S. Patent & Trademark Office: "An inspection system includes a ground penetrating radar (GPR) sensor configured to provide at least one probe signal to a portion of a structure and to receive at least one return signal resulting fr...