US Patent Issued to NEC on Sept. 8 for "Optical coherence tomography analysis apparatus, optical coherence tomography analysis method, and non-transitory recording medium" (Japanese Inventor)

ALEXANDRIA, Va., Sept. 8 -- United States Patent no. 12,727,789, issued on Sept. 8, was assigned to NEC Corp. (Tokyo).

"Optical coherence tomography analysis apparatus, optical coherence tomography analysis method, and non-transitory recording medium" was invented by Shigeru Nakamura (Tokyo).

According to the abstract* released by the U.S. Patent & Trademark Office: "An optical coherence tomography analysis apparatus includes: an acquisition unit that performs optical coherence tomography by applying a light beam, and that acquires three-dimensional luminance data about the skin; a position extraction unit that extracts an epidermis position, for each tomography image obtained by scanning in a fast axis direction of the light beam, in the...