US Patent Issued to NEC on Sept. 8 for "Early root cause localization" (New Jersey, Florida Inventors)

ALEXANDRIA, Va., Sept. 8 -- United States Patent no. 12,730,702, issued on Sept. 8, was assigned to NEC Corp. (Tokyo).

"Early root cause localization" was invented by Zhengzhang Chen (Princeton Junction, N.J.), Haifeng Chen (West Windsor, N.J.), Yanchi Liu (Princeton, N.J.), LuAn Tang (Cranbury, N.J.), Haoyu Wang (Plainsboro, N.J.) and Dongjie Wang (Orlando, Fla.).

According to the abstract* released by the U.S. Patent & Trademark Office: "Methods and systems for root cause analysis include combining system logs and system metrics into time-series data. Individual root cause analysis is performed to determine individual causal scores for respective system entities. Topological root cause analysis is performed to capture topological patter...