US Patent Issued to NEC on Sept. 15 for "Monitoring system, monitoring device, monitoring method" (Japanese Inventors)

ALEXANDRIA, Va., Sept. 15 -- United States Patent no. 12,736,681, issued on Sept. 15, was assigned to NEC Corp. (Tokyo).

"Monitoring system, monitoring device, monitoring method" was invented by Hidemi Noguchi (Tokyo) and Junichi Abe (Tokyo).

According to the abstract* released by the U.S. Patent & Trademark Office: "A first point cloud acquisition unit controls a first fixed-point three-dimensional LiDAR scanner in such a way that the first fixed-point three-dimensional LiDAR scanner performs scanning in a low-density scanning range including a monitoring target in a scanning range and generates a low-density point cloud. An alignment unit aligns the low-density point cloud and known three-dimensional shape data about the monitoring targ...