US Patent Issued to NEC on Nov. 3 for "Deterioration prediction device, deterioration prediction method, and recording medium" (Japanese Inventors)

ALEXANDRIA, Va., Nov. 3 -- United States Patent no. 12,784,441, issued on Nov. 3, was assigned to NEC Corp. (Tokyo).

"Deterioration prediction device, deterioration prediction method, and recording medium" was invented by Chisato Sugawara (Tokyo), Toshimichi Yokote (Tokyo), Yosuke Kimura (Tokyo), Yusuke Mizukoshi (Tokyo), Takakazu Ishii (Tokyo), Hiromichi Hirata (Tokyo), Shouhei Ohno (Tokyo) and Nana Jumonji (Tokyo).

According to the abstract* released by the U.S. Patent & Trademark Office: "A deterioration prediction device according to the present disclosure is provided with: a sensor history information acquisition means that acquires sensor history information of a structure; a strata information acquisition means that acquires strata...