US Patent Issued to NEC on May 19 for "Deterioration assessment device, deterioration assessment method, and recording medium" (Japanese Inventors)

ALEXANDRIA, Va., May 19 -- United States Patent no. 12,631,747, issued on May 19, was assigned to NEC Corp. (Tokyo).

"Deterioration assessment device, deterioration assessment method, and recording medium" was invented by Nana Jumonji (Tokyo), Kaori Iwafuchi (Tokyo), Yosuke Kimura (Tokyo), Chisato Sugawara (Tokyo), Takakazu Ishii (Tokyo), Daisuke Hashizume (Tokyo), Hiromichi Hirata (Tokyo) and Shouhei Ohno (Tokyo).

According to the abstract* released by the U.S. Patent & Trademark Office: "A deterioration assessment device includes: a memory; and at least one processor coupled to the memory. The processor performs operations. The operations include: acquiring information on displacement of a ground surface; extracting a position at which ...