US Patent Issued to NEC on March 31 for "Adversarial example detection device, adversarial example detection method, and program" (Japanese Inventors)

ALEXANDRIA, Va., March 31 -- United States Patent no. 12,592,068, issued on March 31, was assigned to NEC Corp. (Tokyo).

"Adversarial example detection device, adversarial example detection method, and program" was invented by Takuma Amada (Tokyo), Kazuya Kakizaki (Tokyo) and Toshinori Araki (Tokyo).

According to the abstract* released by the U.S. Patent & Trademark Office: "An adversarial example detection device includes a first feature extraction unit configured to extract first features with respect to input data and comparative data in a first calculation method, a second feature extraction unit configured to extract second features with respect to the input data and the comparative data in a second calculation method different from ...