US Patent Issued to NEC on June 9 for "Abnormality identification system using laser light, abnormality identification method using laser light, and storage medium" (Japanese Inventor)

ALEXANDRIA, Va., June 9 -- United States Patent no. 12,650,514, issued on June 9, was assigned to NEC Corp. (Tokyo).

"Abnormality identification system using laser light, abnormality identification method using laser light, and storage medium" was invented by Katsuhiro Yutani (Tokyo).

According to the abstract* released by the U.S. Patent & Trademark Office: "The identification system includes: an acquisition circuit that, on the basis of laser light illuminated onto respective positions in a space of interest including the stationary structure, and reflected light of the laser light, acquires position information corresponding to the respective positions and wavelength information based on the wavelength of the reflected light reflected ...