US Patent Issued to NEC on July 28 for "Estimation device, estimation method, and storage medium" (Japanese Inventors)

ALEXANDRIA, Va., July 28 -- United States Patent no. 12,694,560, issued on July 28, was assigned to NEC Corp. (Tokyo).

"Estimation device, estimation method, and storage medium" was invented by Yasunori Babazaki (Tokyo) and Hiroyoshi Miyano (Tokyo).

According to the abstract* released by the U.S. Patent & Trademark Office: "An estimation device 3X mainly includes a feature point estimation means 35X, a representative point candidate determination means 37X, and a representative point estimation means 38X. The feature point estimation means 35X estimates plural feature points relating to an object. The representative point candidate determination means 37X determines plural representative point candidates that are candidates of a represent...