US Patent Issued to NEC on July 21 for "Abnormality detection system, abnormality detection device, abnormality detection method, and computer readable medium" (Japanese Inventors)

ALEXANDRIA, Va., July 21 -- United States Patent no. 12,687,634, issued on July 21, was assigned to NEC Corp. (Tokyo).

"Abnormality detection system, abnormality detection device, abnormality detection method, and computer readable medium" was invented by Akira Tsuji (Tokyo) and Shigeo Suzuki (Tokyo).

According to the abstract* released by the U.S. Patent & Trademark Office: "An abnormality detection system includes a measurement unit configured to acquire at least three-dimensional data indicating a distance to a target and a shape of the target by performing measurement, a central management unit configured to receive the three-dimensional data acquired by the measurement unit from the measurement unit, and a measurement data evaluation...