US Patent Issued to NEC on July 14 for "Fatigue estimation device, fatigue estimation method, and storage medium" (Japanese Inventors)

ALEXANDRIA, Va., July 14 -- United States Patent no. 12,678,106, issued on July 14, was assigned to NEC Corp. (Tokyo).

"Fatigue estimation device, fatigue estimation method, and storage medium" was invented by Jingwen Lu (Tokyo), Tasuku Kitade (Tokyo) and Masanori Tsujikawa (Tokyo).

According to the abstract* released by the U.S. Patent & Trademark Office: "In a fatigue estimation device mainly includes a normalization process means 14X, and a fatigue estimation means 16X. The normalization process means 14X performs a normalization process based on an attribute of a test subject with respect to biological data of the test subject. The fatigue estimation means 16X estimates a fatigue level of the test subject based on the biological data ...