US Patent Issued to NEC on July 14 for "Chart, manufacturing method, determination system, determination method, and recording medium" (Japanese Inventors)

ALEXANDRIA, Va., July 14 -- United States Patent no. 12,680,875, issued on July 14, was assigned to NEC Corp. (Tokyo).

"Chart, manufacturing method, determination system, determination method, and recording medium" was invented by Chisato Funayama (Tokyo) and Masato Tsukada (Tokyo).

According to the abstract* released by the U.S. Patent & Trademark Office: "A chart includes: a substrate; a first skin reflection patch part that is formed on the substrate and that simulates reflection of near-infrared rays of a predetermined wavelength, in a skin of a living body of a first skin color; and a second skin reflection patch part that is formed on the substrate and that simulates reflection of the near-infrared rays of the predetermined waveleng...