US Patent Issued to NEC on Feb. 17 for "Inspection system for decision making support" (Japanese Inventor)

ALEXANDRIA, Va., Feb. 17 -- United States Patent no. 12,555,251, issued on Feb. 17, was assigned to NEC Corp. (Tokyo).

"Inspection system for decision making support" was invented by Azusa Sawada (Tokyo).

According to the abstract* released by the U.S. Patent & Trademark Office: "An inspection system includes: an identification model learning means that performs machine-learning of a model identifying the type of a target object from time-series data representing the movement trajectory of the target object obtained by observation; a confidence level prediction model learning means that performs machine-learning of a confidence level prediction model estimating the confidence level of an estimation result by the identification model from ...