US Patent Issued to NEC on Feb. 17 for "Deterioration determination device, deterioration determination method, and recording medium" (Japanese Inventors)

ALEXANDRIA, Va., Feb. 17 -- United States Patent no. 12,553,195, issued on Feb. 17, was assigned to NEC Corp. (Tokyo).

"Deterioration determination device, deterioration determination method, and recording medium" was invented by Nana Jumonji (Tokyo), Yosuke Kimura (Tokyo), Chisato Sugawara (Tokyo), Takakazu Ishii (Tokyo), Shouhei Ohno (Tokyo), Hiromichi Hirata (Tokyo) and Daisuke Hashizume (Tokyo).

According to the abstract* released by the U.S. Patent & Trademark Office: "A deterioration determination device includes: a memory; and at least one processor coupled to the memory. The processor performs operations. The operations include: acquiring a diagnosis result of first deterioration of a structure and a determination result of displa...