ALEXANDRIA, Va., April 15 -- United States Patent no. 12,602,833, issued on April 14, was assigned to NEC Corp. (Tokyo).
"Image analysis device and image analysis method" was invented by Taichi Tanaka (Tokyo).
According to the abstract* released by the U.S. Patent & Trademark Office: "The image analysis device 100 includes a pixel selection unit 11 which selects multiple pixels at a plurality of positions in one image among multiple images in which the same area is recorded, a dimension reduction unit 12 which compresses a complex vector as an evaluation value when an evaluation function is optimized into a low-dimensional space, an expanding unit 13 which returns a compression result by the dimension reduction unit 12 to an original pixe...