US Patent Issued to Nearfield Instruments on Sept. 8 for "Atomic force microscope (AFM) device and method of operating the same" (Dutch Inventors)

ALEXANDRIA, Va., Sept. 8 -- United States Patent no. 12,730,127, issued on Sept. 8, was assigned to Nearfield Instruments B.V. (Rotterdam, Netherlands).

"Atomic force microscope (AFM) device and method of operating the same" was invented by Jakob Van De Laar (Oosterhout, Netherlands), Hamed Sadeghian Marnani (Rotterdam, Netherlands) and Arseniy Kalinin (Rotterdam, Netherlands).

According to the abstract* released by the U.S. Patent & Trademark Office: "An atomic force microscopy (AFM) device (1) is disclosed that comprises at least one scan head for scanning a sample (9). A first actuator (20) cooperates with at least one of the scan head or a substrate holder (95) for moving a probe tip of the scan head and the sample relative to each ot...