US Patent Issued to NCR Atleos on Feb. 17 for "Terminal power supply degradation detection" (Canadian, American Inventors)

ALEXANDRIA, Va., Feb. 17 -- United States Patent no. 12,555,001, issued on Feb. 17, was assigned to NCR Atleos Corp. (Atlanta).

"Terminal power supply degradation detection" was invented by Yingying Cai (Atlanta), Ryan Albert Breeze (Guelph, Canada), Kun Zhu (Smyrna, Ga.), Mena Guirguis (Mississauga, Canada) and Virginia-May Risebrough Barnes (Seagrave, Canada).

According to the abstract* released by the U.S. Patent & Trademark Office: "Event streams of terminals for a given interval of time are preprocessed to label event types and label predefined time-based or sequence-based patterns associated with terminal power supply unit (PSU) failures. The labeled event streams are provided as input to a trained machine-learning model (MLM), whic...