US Patent Issued to National University of Singapore on July 14 for "Ion microscope" (Singaporean Inventor)

ALEXANDRIA, Va., July 14 -- United States Patent no. 12,683,113, issued on July 14, was assigned to National University of Singapore (Singapore).

"Ion microscope" was invented by Jeroen Anton Van Kan (Singapore).

According to the abstract* released by the U.S. Patent & Trademark Office: "An ion microscope, a method of constructing an ion microscope, and a method of aligning an ion beam in an ion microscope. The microscope comprises a nano-aperture ion source; and a focusing system; wherein the focusing system is configured for selectively coaxially focusing an ion beam generated from an electron beam ionizing an ionizing gas in the nano-aperture ion source and the electron beam."

The patent was filed on Dec. 24, 2021, under Application N...