US Patent Issued to National Technology & Engineering Solutions of Sandia on Oct. 20 for "Path-integrated x-ray images for digital image correlation" (New Mexico, California, Illinois Inventors)

ALEXANDRIA, Va., Oct. 21 -- United States Patent no. 12,768,801, issued on Oct. 20, was assigned to National Technology & Engineering Solutions of Sandia LLC (Albuquerque, N.M.).

"Path-integrated x-ray images for digital image correlation" was invented by Elizabeth M. C. Jones (Cedar Crest, N.M.), Caroline Winters (Cedar Crest, N.M.), Enrico C. Quintana (Albuquerque, N.M.), Benjamin Roberts Halls (Albuquerque, N.M.), Samuel Saiid Fayad (Urbana, Ill.) and Dayna Glen Obenauf (Lancaster, Calif.).

According to the abstract* released by the U.S. Patent & Trademark Office: "Digital image correlation is provided. The method comprises applying two or more unique X-ray attenuating patterns to a number of test samples and then applying physical def...