US Patent Issued to National Central University on June 23 for "Optical wavefront measuring device and measuring method thereof" (Taiwanese Inventor)

ALEXANDRIA, Va., July 15 -- United States Patent no. 12,663,336, issued on June 23, was assigned to National Central University (Taoyuan City, Taiwan).

"Optical wavefront measuring device and measuring method thereof" was invented by Chao-Wen Liang (Taoyuan City, Taiwan).

According to the abstract* released by the U.S. Patent & Trademark Office: "A device and method for measuring the decentration of optics under test is provided. The device comprises a rotational spindle for loading and rotating the optics under test, a light source module for providing incident light beam to the optics under test, and a wavefront sensor for receiving testing light beams with different exposures from the optics under test at a plurality of azimuthal direc...