US Patent Issued to NANYA TECHNOLOGY on Nov. 3 for "Method of testing semiconductor device" (Taiwanese Inventors)

ALEXANDRIA, Va., Nov. 3 -- United States Patent no. 12,782,393, issued on Nov. 3, was assigned to NANYA TECHNOLOGY Corp. (New Taipei City, Taiwan).

"Method of testing semiconductor device" was invented by Ting-Wei Yu (New Taipei City, Taiwan) and Kuan-Tsung Lin (New Taipei City, Taiwan).

According to the abstract* released by the U.S. Patent & Trademark Office: "The present disclosure provides a method of testing a semiconductor device. The method includes: providing a wafer on a chuck; moving the chuck to a first expected position under a probe card; moving the chuck from the first expected position to a second expected position so that a plurality of dies of the wafer contact a plurality of pins of the probe card; testing a first portio...