ALEXANDRIA, Va., June 16 -- United States Patent no. 12,656,673, issued on June 16, was assigned to NANYA TECHNOLOGY Corp. (New Taipei City, Taiwan).
"Method of manufacturing semiconductor structure" was invented by Cheng-Wei Wang (Taoyuan City, Taiwan).
According to the abstract* released by the U.S. Patent & Trademark Office: "The present disclosure provides a method of manufacturing a semiconductor structure. The method includes several operations. A substrate including a device region and a scribe line region is provided. A first layer is formed over the substrate. A first photoluminescent layer is formed over the first layer in the scribe line region. The first layer and the first photoluminescent layer are patterned to form a first ...