US Patent Issued to NANO-X on Oct. 27 for "Probe-head for electrical device inspection and manufacturing method thereof" (South Korean Inventor)

ALEXANDRIA, Va., Oct. 27 -- United States Patent no. 12,775,022, issued on Oct. 27, was assigned to NANO-X Co. LTD (Suwon-si, South Korea).

"Probe-head for electrical device inspection and manufacturing method thereof" was invented by Pil Kuk Jang (Seoul, South Korea).

According to the abstract* released by the U.S. Patent & Trademark Office: "Disclosed is a probe-head capable of simultaneously inspecting a plurality of devices under test. The probe head includes an elastic body formed by laminating a plurality of elastic layers, with an electrode portion embedded therein. This structure efficiently absorbs shock or load that occurs during contact with the devices under test, preventing damage to both the devices and the probe head. Furth...