ALEXANDRIA, Va., Nov. 3 -- United States Patent no. 12,782,109, issued on Nov. 3, was assigned to Munro Design & Technologies LLC (Ontario, N.Y.).

"Reflective co-axial interferometer systems and methods thereof" was invented by James F. Munro (Ontario, N.Y.) and Robert D. Niederriter (Albany, Calif.).

According to the abstract* released by the U.S. Patent & Trademark Office: "An interferometer system for measuring the displacement of a location of a test surface includes a reference arm comprising two reflective optical elements with optical power, a measurement arm comprising two reflective optical elements with optical power wherein one of the optical elements of the reference arm is one of the optical elements of the measurement arm. A...