US Patent Issued to MONSTR SENSE TECHNOLOGIES on Sept. 22 for "Layer thickness determination by four-wave-mixing spectroscopy" (American, German Inventors)

ALEXANDRIA, Va., Sept. 24 -- United States Patent no. 12,742,635, issued on Sept. 22, was assigned to MONSTR SENSE TECHNOLOGIES LLC (Ann Arbor, Mich.).

"Layer thickness determination by four-wave-mixing spectroscopy" was invented by Eric W. Martin (Saline, Mich.), Torben L. Purz (Nordhorn, Germany) and Steven T. Cundiff (Ann Arbor, Mich.).

According to the abstract* released by the U.S. Patent & Trademark Office: "A method determines the number of layers in a sample material. The method includes measuring, as a function of two or more wavelengths, a four-wave mixing (FWM) spectrum of the sample material. The method further includes using the FWM spectrum to determine a thickness of the sample material, wherein the thickness is a number of...