US Patent Issued to Modus Test on Aug. 25 for "Low profile electronic testing system with flexible test PCB format" (Texas Inventors)

ALEXANDRIA, Va., Aug. 25 -- United States Patent no. 12,716,913, issued on Aug. 25, was assigned to Modus Test LLC (Richardson, Texas).

"Low profile electronic testing system with flexible test PCB format" was invented by Lynwood Adams (Rockwall, Texas), Jack Lewis (Richardson, Texas) and Reagan Oliver (Rowlett, Texas).

According to the abstract* released by the U.S. Patent & Trademark Office: "A compact testing system for sockets is presented having a removable and easily replaceable DUT PCB electrically connected with the electrical testing components of the system. The DUT PCB includes a socket to receive a DUT having electrical contacts. In one or more arrangements, the system includes a housing forming a hollow interior and a motherb...