ALEXANDRIA, Va., May 5 -- United States Patent no. 12,620,548, issued on May 5, was assigned to Mochii Inc. (Seattle).
"Transmission electron microscopy" was invented by Christopher Su-Yan Own (Seattle) and Matthew Francis Murfitt (Seattle).
According to the abstract* released by the U.S. Patent & Trademark Office: "A transmission electron microscope is provided for imaging a sample. The microscope has a stage to hold a sample and an electron beam column to direct an electron beam onto a field of view on the sample. The electron beam column includes an electron beam source to generate an electron beam, and electron beam optics to converge the electron beam onto a field of view on the sample. The microscope also has a beam scanner to scan ...