US Patent Issued to MITUTOYO on Nov. 3 for "Three-dimensional geometry measurement apparatus, three-dimensional geometry measurement method, and storage medium" (Japanese Inventor)

ALEXANDRIA, Va., Nov. 3 -- United States Patent no. 12,784,244, issued on Nov. 3, was assigned to MITUTOYO Corp. (Kanagawa, Japan).

"Three-dimensional geometry measurement apparatus, three-dimensional geometry measurement method, and storage medium" was invented by Kaoru Miyata (Kanagawa, Japan).

According to the abstract* released by the U.S. Patent & Trademark Office: "Three-dimensional geometry measurement apparatuses includes: a first identification part that identifies a primary absolute phase value corresponding to each of a plurality of pixels of a first image capturing part; a second identification part that identifies a secondary absolute phase value corresponding to each of a plurality of pixels of a second image capturing part;...