US Patent Issued to MITUTOYO on March 31 for "Measuring device" (Japanese Inventors)

ALEXANDRIA, Va., March 31 -- United States Patent no. 12,591,354, issued on March 31, was assigned to MITUTOYO Corp. (Kanagawa, Japan).

"Measuring device" was invented by Yuya Fusayasu (Miyazaki, Japan), Hiroomi Honda (Miyazaki, Japan), Takashi Shintaku (Hiroshima, Japan) and Kazuya Ibi (Hiroshima, Japan).

According to the abstract* released by the U.S. Patent & Trademark Office: "A surface texture measuring machine includes a display section, a touch panel arranged on the display section, a key group, a display control section that causes a first setting screen to be displayed on the display section, a setting section that creates a measurement condition in accordance with an input operation on the first setting screen through the touch ...