US Patent Issued to MITUTOYO on March 24 for "Automatic measuring device and control method of the same" (Japanese Inventors)

ALEXANDRIA, Va., March 24 -- United States Patent no. 12,584,734, issued on March 24, was assigned to MITUTOYO Corp. (Kanagawa, Japan).

"Automatic measuring device and control method of the same" was invented by Keita Ogawa (Kanagawa, Japan), Shuji Hayashida (Kanagawa, Japan) and Masashi Yamaji (Hiroshima, Japan).

According to the abstract* released by the U.S. Patent & Trademark Office: "An automatic measuring device includes a micrometer including a spindle that moves forward and backward to be brought into contact with or away from a workpiece and a displacement detector unit that detects displacement of the spindle, and an automatic operation unit that automates the forward and backward movement of the spindle by power. The automatic ...