US Patent Issued to MITUTOYO on July 14 for "Automatic measuring systems and control method for automatic measuring systems" (Japanese Inventors)

ALEXANDRIA, Va., July 14 -- United States Patent no. 12,682,495, issued on July 14, was assigned to MITUTOYO Corp. (Kanagawa, Japan).

"Automatic measuring systems and control method for automatic measuring systems" was invented by Daisuke Sakai (Saitama, Japan), Seiji Sasaki (Saitama, Japan) and Kunio Ueda (Kanagawa, Japan).

According to the abstract* released by the U.S. Patent & Trademark Office: "An automatic measuring system includes a measuring sensor tool that detects a surface of an object to be measured to measure a dimension or a shape of the object to be measured, a moving mechanism that relatively moves the measuring sensor tool with respect to the object to be measured, and an observation camera that images the object to be me...