US Patent Issued to MITUTOYO on July 14 for "Automatic measuring system and control method for automatic measuring system" (Japanese Inventors)

ALEXANDRIA, Va., July 14 -- United States Patent no. 12,681,029, issued on July 14, was assigned to MITUTOYO Corp. (Kanagawa, Japan).

"Automatic measuring system and control method for automatic measuring system" was invented by Seiji Sasaki (Saitama, Japan), Kazuhiko Hidaka (Tokyo) and Daisuke Sakai (Saitama, Japan).

According to the abstract* released by the U.S. Patent & Trademark Office: "There is provided an automatic measuring system that can automate measurement and a control method for automatic measurement. An automatic measuring system includes a measuring sensor tool that detects a surface of an object to be measured with a probe to measure a dimension or a shape of the object to be measured, and a multi-axis moving mechanism t...