ALEXANDRIA, Va., April 7 -- United States Patent no. 12,597,165, issued on April 7, was assigned to MITUTOYO Corp. (Kanagawa, Japan).
"Calibration method and measurement system" was invented by Ryosuke Tanaka (Oberndorf am Neckar, Germany).
According to the abstract* released by the U.S. Patent & Trademark Office: "A calibration method including: a first imaging step of imaging a calibration jig, a second imaging step of imaging the calibration jig after causing the calibration jig to be moved in a predetermined first direction, a third imaging step of imaging the calibration jig after causing the calibration jig to be moved in a predetermined second direction, a fourth imaging step of imaging the calibration jig, a fifth imaging step of ...