ALEXANDRIA, Va., Nov. 3 -- United States Patent no. 12,782,292, issued on Nov. 3, was assigned to MITSUBISHI HEAVY INDUSTRIES LTD. (Tokyo).
"Diagnosis method, diagnosis device, and program" was invented by Tsuyoshi Tomita (Tokyo) and Yushi Iwata (Tokyo).
According to the abstract* released by the U.S. Patent & Trademark Office: "Provided is a method for quantitatively diagnosing damage to TBC. A diagnosis method is a method for diagnosing a damage state of a coating material coated on a surface of a member and includes: a step of setting a diagnosis target portion in an image obtained by capturing the surface of the member; a step of specifying a reference portion in the image; a step of individually calculating L*a*b* values of the diagn...