US Patent Issued to MITSUBISHI ELECTRIC on Sept. 1 for "Test support apparatus, test support method, and non-transitory computer readable medium" (Japanese Inventors)

ALEXANDRIA, Va., Sept. 1 -- United States Patent no. 12,724,683, issued on Sept. 1, was assigned to MITSUBISHI ELECTRIC Corp. (Tokyo).

"Test support apparatus, test support method, and non-transitory computer readable medium" was invented by Atsushi Okazato (Tokyo) and Yoshihiro Ohta (Tokyo).

According to the abstract* released by the U.S. Patent & Trademark Office: "A test support apparatus (100) includes an operation definition information conversion unit (120). Regarding each device included in a test subject that includes at least one device, the operation definition information conversion unit (120) generates for each state of each device, state transition information indicating a transition of operation to be executed by each device...