US Patent Issued to Mitsubishi Electric on June 23 for "Semiconductor device enabling quick and reliable screening" (Japanese Inventors)

ALEXANDRIA, Va., July 15 -- United States Patent no. 12,666,724, issued on June 23, was assigned to Mitsubishi Electric Corp. (Tokyo).

"Semiconductor device enabling quick and reliable screening" was invented by Makoto Ueno (Fukuoka, Japan) and Kazuhiro Nishimura (Fukuoka, Japan).

According to the abstract* released by the U.S. Patent & Trademark Office: "Provided is a semiconductor device that enables reliable screening to be performed in a short amount of time. The semiconductor device includes a switching element, a control circuit, a Zener diode, a first terminal, and a second terminal. The switching element, the control circuit, and the Zener diode are formed in the semiconductor substrate. The control circuit controls the state of t...