US Patent Issued to Mitsubishi Electric on July 21 for "Inspection method for semiconductor laser device and inspection device for semiconductor laser device" (Japanese Inventor)

ALEXANDRIA, Va., July 21 -- United States Patent no. 12,689,180, issued on July 21, was assigned to Mitsubishi Electric Corp. (Tokyo).

"Inspection method for semiconductor laser device and inspection device for semiconductor laser device" was invented by Akio Shirasaki (Tokyo).

According to the abstract* released by the U.S. Patent & Trademark Office: "An inspection method for inspecting a semiconductor laser device integrated with a semiconductor laser, an electroabsorption modulator for input the output of the semiconductor laser, and a photodetector for detecting intensity of part of the laser light output from the semiconductor laser includes a step of acquiring a transverse-mode light output characteristic that is a relationship betw...