US Patent Issued to MITSUBISHI ELECTRIC on July 21 for "Electromagnetic wave detector, electromagnetic wave detector array, and manufacturing method of electromagnetic wave detector" (Japanese Inventors)

ALEXANDRIA, Va., July 21 -- United States Patent no. 12,690,279, issued on July 21, was assigned to MITSUBISHI ELECTRIC Corp. (Tokyo).

"Electromagnetic wave detector, electromagnetic wave detector array, and manufacturing method of electromagnetic wave detector" was invented by Satoshi Okuda (Tokyo), Shimpei Ogawa (Tokyo), Shoichiro Fukushima (Tokyo) and Masaaki Shimatani (Tokyo).

According to the abstract* released by the U.S. Patent & Trademark Office: "An electromagnetic wave detector includes a semiconductor substrate, a first insulating film disposed on the semiconductor substrate and formed so as to expose a part of the semiconductor substrate, a first electrode disposed on the first insulating film, a two-dimensional material layer...