US Patent Issued to Mitsubishi Electric on Feb. 24 for "Semiconductor device and method for diagnosing deterioration of semiconductor device" (Japanese Inventor)

ALEXANDRIA, Va., Feb. 24 -- United States Patent no. 12,564,112, issued on Feb. 24, was assigned to Mitsubishi Electric Corp. (Tokyo).

"Semiconductor device and method for diagnosing deterioration of semiconductor device" was invented by Yumie Kitajima (Tokyo).

According to the abstract* released by the U.S. Patent & Trademark Office: "Provided is a technique for enhancing the accuracy of deterioration diagnosis in a semiconductor device. The semiconductor device relating to the technique disclosed in the present specification is provided with a case, a semiconductor chip inside the case, a metal wire bonded to an upper surface of the semiconductor chip, at least one test piece inside the case, and a pair of terminals provided outside the...