ALEXANDRIA, Va., April 7 -- United States Patent no. 12,595,998, issued on April 7, was assigned to MINEBEA MITSUMI Inc. (Nagano, Japan).

"Strain gauge" was invented by Iku Ishihara (Nagano, Japan), Aya Ono (Nagano, Japan), Yosuke Ogasa (Nagano, Japan), Yuta Aizawa (Nagano, Japan), Toshiaki Asakawa (Nagano, Japan) and Atsushi Kitamura (Nagano, Japan).

According to the abstract* released by the U.S. Patent & Trademark Office: "According to the present disclosure, a strain gauge has: a flexible substrate; a resistor formed on the substrate; and a pair of electrodes formed on the substrate and electrically connected with the resistor via conductive traces, and, in this strain gauge, a width of the resistor is 10 micro metre or more and 100 m...