US Patent Issued to MIDIAGNOSTICS on Oct. 20 for "Integrated sampling and analysis device" (Belgian Inventor)

ALEXANDRIA, Va., Oct. 21 -- United States Patent no. 12,765,801, issued on Oct. 20, was assigned to MIDIAGNOSTICS NV (Leuven, Belgium).

"Integrated sampling and analysis device" was invented by David Mikaelian (Brussels).

According to the abstract* released by the U.S. Patent & Trademark Office: "The field of the invention generally relates to sample collection, for example of a sample being an exhaled breath. In particular, an integrated device is disclosed herein comprising a silicon chip for sampling particulate matter from a sample and for analysis, preferably by a protocol using thermocycling, of the particulate matter as collected from the sample. Further, point-of-care (PoC) and self-use analysis systems compatible with the integra...