US Patent Issued to Microvision on June 2 for "Reflective material and markers for light source calibration" (Florida Inventors)

ALEXANDRIA, Va., June 2 -- United States Patent no. 12,644,973, issued on June 2, was assigned to Microvision Inc. (Redmond, Wash.).

"Reflective material and markers for light source calibration" was invented by Stephen L. Mielke (Oviedo, Fla.), Julio Cesar Castaneda (Winter Park, Fla.), Aseem D. Patil (Orlando, Fla.) and Christopher Gary Sentelle (Orlando, Fla.).

According to the abstract* released by the U.S. Patent & Trademark Office: "A system comprises a light source, a scanner, a reference reflectivity material, a detector, and a processor. The light source is configured to emit light, and the scanner is configured to scan the emitted light across at least a portion of a reachable region including a field of regard through a window....