US Patent Issued to MICROTESTERS on July 14 for "System and method for measuring RDSon, RDSoff and current collapse on semiconductor devices" (Wyoming, North Dakota, Arizona Inventors)

ALEXANDRIA, Va., July 14 -- United States Patent no. 12,681,071, issued on July 14, was assigned to MICROTESTERS LLC (Cheyenne, Wyo.).

"System and method for measuring RDSon, RDSoff and current collapse on semiconductor devices" was invented by Andre Claude Olivier (Cheyenne, Wyo.), Nicholas Emil Olivier (Minot, N.D.) and William Dopson (Chandler, Ariz.).

According to the abstract* released by the U.S. Patent & Trademark Office: "A new system and method for measuring RDSon, RDSoff and current collapse on semiconductor devices is provided. The system and method operate by measuring the current flow through the transistor, instead of measuring the voltage across the device under test. The viewing resistor gives us an accurate picture of the...